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    Wavelet Selection for Bearing Defect Diagnosis

    New search for: Yan, R.Q.
    New search for: Gao, R.X.
    New search for: Chu, F.
    New search for: Ouyang, H.
    New search for: Silberschmidt, V.
    New search for: Garibaldi, L.
    New search for: Surace, C.
    New search for: Ostachowicz, W.M.
    New search for: Jiang, D.

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    Wavelet Selection for Bearing Defect Diagnosis

    New search for: Yan, R.Q.
    New search for: Gao, R.X.
    New search for: Chu, F.
    New search for: Ouyang, H.
    New search for: Silberschmidt, V.
    New search for: Garibaldi, L.
    New search for: Surace, C.
    New search for: Ostachowicz, W.M.
    New search for: Jiang, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Wavelet Selection for Bearing Defect Diagnosis

    New search for: Yan, R.Q.
    New search for: Gao, R.X.
    New search for: Chu, F.
    New search for: Ouyang, H.
    New search for: Silberschmidt, V.
    New search for: Garibaldi, L.
    New search for: Surace, C.
    New search for: Ostachowicz, W.M.
    New search for: Jiang, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Wavelet Selection for Bearing Defect Diagnosis

    Contributors:

    Yan, R.Q. (author) / Gao, R.X. (author) / Chu, F. / Ouyang, H. / Silberschmidt, V. / Garibaldi, L. / Surace, C. / Ostachowicz, W.M. / Jiang, D.

    Published in:

    Damage Assessment of Structures VIII ; 575-582

    KEY ENGINEERING MATERIALS ; 413/414

    Publication date:

    2009-01-01

    Size:

    8 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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