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Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements
Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements
Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements
Sayad, Y. (author) / Amtablian, S. (author) / Kaminski, A. (author) / Blanc, D. (author) / Carroy, P. (author) / Nouiri, A. (author) / Lemiti, M. (author)
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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