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Self-affinity study of nanostructured porous silicon-crystalline silicon interfaces

Escorcia-Garcia, J. / Cruz-Silva, R. / Agarwal, V.

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Self-affinity study of nanostructured porous silicon-crystalline silicon interfaces

Escorcia-Garcia, J. / Cruz-Silva, R. / Agarwal, V.

Self-affinity study of nanostructured porous silicon-crystalline silicon interfaces

Escorcia-Garcia, J. / Cruz-Silva, R. / Agarwal, V.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

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Document information

Title:

Self-affinity study of nanostructured porous silicon-crystalline silicon interfaces

Contributors:

Escorcia-Garcia, J. (author) / Cruz-Silva, R. (author) / Agarwal, V. (author)

Published in:

APPLIED SURFACE SCIENCE ; 256 ; 645-649

Publication date:

2009-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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