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Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement
Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement
Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement
Atabak, M. (author) / Unverdi, O. (author) / Ozer, H. O. (author) / Oral, A. (author)
APPLIED SURFACE SCIENCE ; 256 ; 1299-1303
2009-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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