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    Field emission measured from nanostructured germanium and silicon thin films

    New search for: Carder, D. A.
    New search for: Markwitz, A.

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    Field emission measured from nanostructured germanium and silicon thin films

    New search for: Carder, D. A.
    New search for: Markwitz, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Field emission measured from nanostructured germanium and silicon thin films

    New search for: Carder, D. A.
    New search for: Markwitz, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
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    Document information
    Title:

    Field emission measured from nanostructured germanium and silicon thin films

    Contributors:

    Carder, D. A. (author) / Markwitz, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 1003-1005

    Publication date:

    2009-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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