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Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr2O3 thin films
Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr2O3 thin films
Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr2O3 thin films
Kemdehoundja, M. (author) / Grosseau-Poussard, J. L. (author) / Dinhut, J. F. (author)
APPLIED SURFACE SCIENCE ; 256 ; 2719-2725
2010-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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