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Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces
Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces
Applications of aberration corrected scanning transmission electron microscopy and electron energy loss spectroscopy to thin oxide films and interfaces
Varela, M. (author) / Gazquez, J. (author) / Lupini, A.R. (author) / Luck, J.T. (author) / Torija, M.A. (author) / Sharma, M. (author) / Leighton, C. (author) / Biegalski, M.D. (author) / Christen, H.M. (author) / Murfitt, M. (author)
INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 101 ; 21-26
2010-01-01
6 pages
Article (Journal)
English
DDC:
669.9
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