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    Overview of the Grain Size Effects on the Mechanical and Deformation Behaviour of Electrodeposited Nanocrystalline Nickel - From Nanoindentation to High Pressure Torsion

    New search for: Yang, B.
    New search for: Vehoff, H.
    New search for: Pippan, R.
    New search for: Zhao, Y.
    New search for: Liao, X.

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    Overview of the Grain Size Effects on the Mechanical and Deformation Behaviour of Electrodeposited Nanocrystalline Nickel - From Nanoindentation to High Pressure Torsion

    New search for: Yang, B.
    New search for: Vehoff, H.
    New search for: Pippan, R.
    New search for: Zhao, Y.
    New search for: Liao, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Overview of the Grain Size Effects on the Mechanical and Deformation Behaviour of Electrodeposited Nanocrystalline Nickel - From Nanoindentation to High Pressure Torsion

    New search for: Yang, B.
    New search for: Vehoff, H.
    New search for: Pippan, R.
    New search for: Zhao, Y.
    New search for: Liao, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Overview of the Grain Size Effects on the Mechanical and Deformation Behaviour of Electrodeposited Nanocrystalline Nickel - From Nanoindentation to High Pressure Torsion

    Contributors:

    Yang, B. (author) / Vehoff, H. (author) / Pippan, R. (author) / Zhao, Y. / Liao, X.

    Published in:

    Ductility of Bulk Nanostructured Materials ; 85-98

    MATERIALS SCIENCE FORUM ; 633/634

    Publication date:

    2010-01-01

    Size:

    14 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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