Fabrication and hard X-ray photoemission analysis of photocathodes with sharp solar-blind sensitivity using AlGaN films grown on Si substrates: Fid-Bau Portal

Fabrication and hard X-ray photoemission analysis of photocathodes with sharp solar-blind sensitivity using AlGaN films grown on Si substrates

Sumiya, M. / Kamo, Y. / Ohashi, N. / Takeguchi, M. / Heo, Y. U. / Yoshikawa, H. / Ueda, S. / Kobayashi, K. / Nihashi, T. / Hagino, M.

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Fabrication and hard X-ray photoemission analysis of photocathodes with sharp solar-blind sensitivity using AlGaN films grown on Si substrates

Sumiya, M. / Kamo, Y. / Ohashi, N. / Takeguchi, M. / Heo, Y. U. / Yoshikawa, H. / Ueda, S. / Kobayashi, K. / Nihashi, T. / Hagino, M.

Fabrication and hard X-ray photoemission analysis of photocathodes with sharp solar-blind sensitivity using AlGaN films grown on Si substrates

Sumiya, M. / Kamo, Y. / Ohashi, N. / Takeguchi, M. / Heo, Y. U. / Yoshikawa, H. / Ueda, S. / Kobayashi, K. / Nihashi, T. / Hagino, M.

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Document information

Title:

Fabrication and hard X-ray photoemission analysis of photocathodes with sharp solar-blind sensitivity using AlGaN films grown on Si substrates

Contributors:

Sumiya, M. (author) / Kamo, Y. (author) / Ohashi, N. (author) / Takeguchi, M. (author) / Heo, Y. U. (author) / Yoshikawa, H. (author) / Ueda, S. (author) / Kobayashi, K. (author) / Nihashi, T. (author) / Hagino, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 256 ; 4442-4446

Publication date:

2010-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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