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Polytypism Study in SiC Epilayers Using Electron Backscatter Diffraction
Polytypism Study in SiC Epilayers Using Electron Backscatter Diffraction
Polytypism Study in SiC Epilayers Using Electron Backscatter Diffraction
Kosciewicz, K. (author) / Strupinski, W. (author) / Wierzchowski, W. (author) / Wieteska, K. (author) / Olszyna, A. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M. / Pensl, G. / Rupp, R.
2010-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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