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    Residual Stress Measurement and Simulation of 3C-SiC Single and Poly Crystal Cantilevers

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    Residual Stress Measurement and Simulation of 3C-SiC Single and Poly Crystal Cantilevers

    New search for: Anzalone, R.
    New search for: Camarda, M.
    New search for: Alquier, D.
    New search for: Italia, M.
    New search for: Severino, A.
    New search for: Piluso, N.
    New search for: La Magna, A.
    New search for: Foti, G.
    New search for: Locke, C.
    New search for: Saddow, S.E.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

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    Residual Stress Measurement and Simulation of 3C-SiC Single and Poly Crystal Cantilevers

    New search for: Anzalone, R.
    New search for: Camarda, M.
    New search for: Alquier, D.
    New search for: Italia, M.
    New search for: Severino, A.
    New search for: Piluso, N.
    New search for: La Magna, A.
    New search for: Foti, G.
    New search for: Locke, C.
    New search for: Saddow, S.E.
    New search for: Bauer, A.J.
    New search for: Friedrichs, P.
    New search for: Krieger, M.
    New search for: Pensl, G.
    New search for: Rupp, R.
    New search for: Seyller, T.

    Access

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    Title:

    Residual Stress Measurement and Simulation of 3C-SiC Single and Poly Crystal Cantilevers

    Contributors:

    Anzalone, R. (author) / Camarda, M. (author) / Alquier, D. (author) / Italia, M. (author) / Severino, A. (author) / Piluso, N. (author) / La Magna, A. (author) / Foti, G. (author) / Locke, C. (author) / Saddow, S.E. (author)

    Published in:

    Silicon Carbide and Related Materials 2009 ; 865-868

    MATERIALS SCIENCE FORUM ; 645/648

    Publication date:

    2010-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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