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    Uniformity of fully gravure printed organic field-effect transistors

    New search for: Hambsch, M.
    New search for: Reuter, K.
    New search for: Stanel, M.
    New search for: Schmidt, G.
    New search for: Kempa, H.
    New search for: Fugmann, U.
    New search for: Hahn, U.
    New search for: Hubler, A. C.

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    Uniformity of fully gravure printed organic field-effect transistors

    New search for: Hambsch, M.
    New search for: Reuter, K.
    New search for: Stanel, M.
    New search for: Schmidt, G.
    New search for: Kempa, H.
    New search for: Fugmann, U.
    New search for: Hahn, U.
    New search for: Hubler, A. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Uniformity of fully gravure printed organic field-effect transistors

    New search for: Hambsch, M.
    New search for: Reuter, K.
    New search for: Stanel, M.
    New search for: Schmidt, G.
    New search for: Kempa, H.
    New search for: Fugmann, U.
    New search for: Hahn, U.
    New search for: Hubler, A. C.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Uniformity of fully gravure printed organic field-effect transistors

    Contributors:

    Hambsch, M. (author) / Reuter, K. (author) / Stanel, M. (author) / Schmidt, G. (author) / Kempa, H. (author) / Fugmann, U. (author) / Hahn, U. (author) / Hubler, A. C. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 170 ; 93-98

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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