SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip: Fid-Bau Portal

SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip

Guo, W.-W. / Wang, X.-M. / Li, X.-W.

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SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip

Guo, W.-W. / Wang, X.-M. / Li, X.-W.

SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip

Guo, W.-W. / Wang, X.-M. / Li, X.-W.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SEM Electron Channeling Contrast Imaging of Dislocation Structures in Fatigued [017] Cu Single Crystals Oriented for Critical Double Slip

Contributors:

Guo, W.-W. (author) / Wang, X.-M. (author) / Li, X.-W. (author)

Published in:

MATERIALS TRANSACTIONS ; 51 ; 887-891

Publication date:

2010-01-01

Size:

5 pages

ISSN:

1345-9678

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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