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New method to characterise grain boundary plane orientations based on EBSD orientation microscopy for serial sectioned surfaces
New method to characterise grain boundary plane orientations based on EBSD orientation microscopy for serial sectioned surfaces
New method to characterise grain boundary plane orientations based on EBSD orientation microscopy for serial sectioned surfaces
Chou, C.T. (author) / Gholinia, A. (author)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 26 ; 650-660
2010-01-01
11 pages
Article (Journal)
English
DDC:
620.11
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