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Applicability of Weibull Distribution to Description of Distributed Normalized Critical Current of Bent-Damaged Bi2223 Composite Tape
Applicability of Weibull Distribution to Description of Distributed Normalized Critical Current of Bent-Damaged Bi2223 Composite Tape
Applicability of Weibull Distribution to Description of Distributed Normalized Critical Current of Bent-Damaged Bi2223 Composite Tape
Ochiai, S. (author) / Okuda, H. (author) / Sugano, M. (author) / Hojo, M. (author) / Osamura, K. (author) / Kuroda, T. (author) / Kumakura, H. (author) / Kitaguchi, H. (author) / Itoh, K. (author) / Wada, H. (author)
MATERIALS TRANSACTIONS ; 51 ; 1663-1670
2010-01-01
8 pages
Article (Journal)
English
DDC:
620.11
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