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    Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates

    New search for: Sobiech, M.
    New search for: Kruger, C.
    New search for: Welzel, U.
    New search for: Wang, J.Y.
    New search for: Mittemeijer, E.J.
    New search for: Hugel, W.

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    Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates

    New search for: Sobiech, M.
    New search for: Kruger, C.
    New search for: Welzel, U.
    New search for: Wang, J.Y.
    New search for: Mittemeijer, E.J.
    New search for: Hugel, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates

    New search for: Sobiech, M.
    New search for: Kruger, C.
    New search for: Welzel, U.
    New search for: Wang, J.Y.
    New search for: Mittemeijer, E.J.
    New search for: Hugel, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates

    Contributors:

    Sobiech, M. (author) / Kruger, C. (author) / Welzel, U. (author) / Wang, J.Y. (author) / Mittemeijer, E.J. (author) / Hugel, W. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 25 ; 2166-2174

    Publication date:

    2010-01-01

    Size:

    9 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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