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Surface Wrinkling: A Versatile Platform for Measuring Thin Film Properties
Surface Wrinkling: A Versatile Platform for Measuring Thin Film Properties
Surface Wrinkling: A Versatile Platform for Measuring Thin Film Properties
Chung, J. Y. (author) / Nolte, A. J. (author) / Stafford, C. M. (author)
ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 23 ; 349-368
2011-01-01
20 pages
Article (Journal)
English
DDC:
620.11
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