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    Thickness study of Al:ZnO film for application as a window layer in Cu(In1-xGax)Se2 thin film solar cell

    New search for: Ishizuka, S.
    New search for: Yamada, A.
    New search for: Matsubara, K.
    New search for: Niki, S.
    New search for: Sakurai, T.
    New search for: Akimoto, K.

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    Thickness study of Al:ZnO film for application as a window layer in Cu(In1-xGax)Se2 thin film solar cell

    New search for: Ishizuka, S.
    New search for: Yamada, A.
    New search for: Matsubara, K.
    New search for: Niki, S.
    New search for: Sakurai, T.
    New search for: Akimoto, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness study of Al:ZnO film for application as a window layer in Cu(In1-xGax)Se2 thin film solar cell

    New search for: Ishizuka, S.
    New search for: Yamada, A.
    New search for: Matsubara, K.
    New search for: Niki, S.
    New search for: Sakurai, T.
    New search for: Akimoto, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thickness study of Al:ZnO film for application as a window layer in Cu(In1-xGax)Se2 thin film solar cell

    Contributors:

    Ishizuka, S. (author) / Yamada, A. (author) / Matsubara, K. (author) / Niki, S. (author) / Sakurai, T. (author) / Akimoto, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 4026-4030

    Publication date:

    2011-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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