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    Correlations between intergranular stress corrosion cracking, grain-boundary microchemistry, and grain-boundary electrochemistry for Al-Zn-Mg-Cu alloys

    New search for: Knight, S. P.
    New search for: Birbilis, N.
    New search for: Muddle, B. C.
    New search for: Trueman, A. R.
    New search for: Lynch, S. P.

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    Correlations between intergranular stress corrosion cracking, grain-boundary microchemistry, and grain-boundary electrochemistry for Al-Zn-Mg-Cu alloys

    New search for: Knight, S. P.
    New search for: Birbilis, N.
    New search for: Muddle, B. C.
    New search for: Trueman, A. R.
    New search for: Lynch, S. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Correlations between intergranular stress corrosion cracking, grain-boundary microchemistry, and grain-boundary electrochemistry for Al-Zn-Mg-Cu alloys

    New search for: Knight, S. P.
    New search for: Birbilis, N.
    New search for: Muddle, B. C.
    New search for: Trueman, A. R.
    New search for: Lynch, S. P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Correlations between intergranular stress corrosion cracking, grain-boundary microchemistry, and grain-boundary electrochemistry for Al-Zn-Mg-Cu alloys

    Contributors:

    Knight, S. P. (author) / Birbilis, N. (author) / Muddle, B. C. (author) / Trueman, A. R. (author) / Lynch, S. P. (author)

    Published in:

    CORROSION SCIENCE ; 52 ; 4073-4080

    Publication date:

    2010-01-01

    Size:

    8 pages

    ISSN:

    0010-938X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.16205 / 620

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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