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In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading

Ju, D.Y. / Wang, J.G. / Abe, M.

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In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading

Ju, D.Y. / Wang, J.G. / Abe, M.

In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading

Ju, D.Y. / Wang, J.G. / Abe, M.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

In Situ Stress Measurement Method Based on X-Ray Diffraction under Biaxial Tensile Loading

Contributors:

Ju, D.Y. (author) / Wang, J.G. (author) / Abe, M. (author) / Tan, Y. / Ju, D.

Published in:

Advanced Material Science and Technology ; 615-618

MATERIALS SCIENCE FORUM ; 675/677

Publication date:

2011-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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