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In situ X-ray microtomography characterization of damage in SiCf/SiC minicomposites
In situ X-ray microtomography characterization of damage in SiCf/SiC minicomposites
In situ X-ray microtomography characterization of damage in SiCf/SiC minicomposites
Chateau, C. (author) / Gelebart, L. (author) / Bornert, M. (author) / Crepin, J. (author) / Boller, E. (author) / Sauder, C. (author) / Ludwig, W. (author)
COMPOSITES SCIENCE AND TECHNOLOGY ; 71 ; 916-924
2011-01-01
9 pages
Article (Journal)
English
DDC:
620.118
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