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    Quantification of crack defect using a new pulsed eddy current probe

    New search for: Yang, B.
    New search for: Zhao, Y.
    New search for: Zhang, W.

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    Quantification of crack defect using a new pulsed eddy current probe

    New search for: Yang, B.
    New search for: Zhao, Y.
    New search for: Zhang, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantification of crack defect using a new pulsed eddy current probe

    New search for: Yang, B.
    New search for: Zhao, Y.
    New search for: Zhang, W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Quantification of crack defect using a new pulsed eddy current probe

    Contributors:

    Yang, B. (author) / Zhao, Y. (author) / Zhang, W. (author)

    Published in:

    NONDESTRUCTIVE TESTING AND EVALUATION ; 26 ; 155-168

    Publication date:

    2011-01-01

    Size:

    14 pages

    ISSN:

    1058-9759

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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