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    Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction

    New search for: Kimura, S.
    New search for: Imai, Y.
    New search for: Sakata, O.
    New search for: Sakai, A.
    New search for: Miyazaki, S.
    New search for: Tabata, H.

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    Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction

    New search for: Kimura, S.
    New search for: Imai, Y.
    New search for: Sakata, O.
    New search for: Sakai, A.
    New search for: Miyazaki, S.
    New search for: Tabata, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction

    New search for: Kimura, S.
    New search for: Imai, Y.
    New search for: Sakata, O.
    New search for: Sakai, A.
    New search for: Miyazaki, S.
    New search for: Tabata, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Nanometer-Scale Characterization Technique for Si Nanoelectric Materials Using Synchrotron Radiation Microdiffraction

    Contributors:

    Kimura, S. (author) / Imai, Y. (author) / Sakata, O. (author) / Sakai, A. (author) / Miyazaki, S. / Tabata, H.

    Published in:

    Technology Evolution for Silicon Nano-Electronics ; 104-109

    KEY ENGINEERING MATERIALS ; 470

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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