Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA: Fid-Bau Portal

Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA

Ortolani, M. / Ricardo, C.L.A. / Lausi, A. / Scardi, P.

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Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA

Ortolani, M. / Ricardo, C.L.A. / Lausi, A. / Scardi, P.

Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA

Ortolani, M. / Ricardo, C.L.A. / Lausi, A. / Scardi, P.

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Check availability in my library

Order at Subito €

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Document information

Title:

Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA

Contributors:

Ortolani, M. (author) / Ricardo, C.L.A. (author) / Lausi, A. (author) / Scardi, P. (author) / Scardi, P. / Ricardo, C.L.A.

Published in:

Residual Stresses VIII ; 115-120

MATERIALS SCIENCE FORUM ; 681

Publication date:

2011-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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