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    Comparison of Curvature and X-Ray Methods for Measuring of Residual Stresses in Hard PVD Coatings

    New search for: Lille, H.
    New search for: Koo, J.
    New search for: Gregor, A.
    New search for: Ryabchikov, A.
    New search for: Sergejev, F.
    New search for: Traksmaa, R.
    New search for: Kulu, P.
    New search for: Scardi, P.
    New search for: Ricardo, C.L.A.

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    Comparison of Curvature and X-Ray Methods for Measuring of Residual Stresses in Hard PVD Coatings

    New search for: Lille, H.
    New search for: Koo, J.
    New search for: Gregor, A.
    New search for: Ryabchikov, A.
    New search for: Sergejev, F.
    New search for: Traksmaa, R.
    New search for: Kulu, P.
    New search for: Scardi, P.
    New search for: Ricardo, C.L.A.

    Access

    Access via TIB
    Check availability in my library
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    Comparison of Curvature and X-Ray Methods for Measuring of Residual Stresses in Hard PVD Coatings

    New search for: Lille, H.
    New search for: Koo, J.
    New search for: Gregor, A.
    New search for: Ryabchikov, A.
    New search for: Sergejev, F.
    New search for: Traksmaa, R.
    New search for: Kulu, P.
    New search for: Scardi, P.
    New search for: Ricardo, C.L.A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Comparison of Curvature and X-Ray Methods for Measuring of Residual Stresses in Hard PVD Coatings

    Contributors:

    Lille, H. (author) / Koo, J. (author) / Gregor, A. (author) / Ryabchikov, A. (author) / Sergejev, F. (author) / Traksmaa, R. (author) / Kulu, P. (author) / Scardi, P. / Ricardo, C.L.A.

    Published in:

    Residual Stresses VIII ; 455-460

    MATERIALS SCIENCE FORUM ; 681

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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