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Automatic fabric defect detection based on 2-dimensional empirical mode decomposition

Li, Z. / Liu, J. / Gao, W. / Pan, R. / Chai, Z.

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Automatic fabric defect detection based on 2-dimensional empirical mode decomposition

Li, Z. / Liu, J. / Gao, W. / Pan, R. / Chai, Z.

Automatic fabric defect detection based on 2-dimensional empirical mode decomposition

Li, Z. / Liu, J. / Gao, W. / Pan, R. / Chai, Z.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Automatic fabric defect detection based on 2-dimensional empirical mode decomposition

Contributors:

Li, Z. (author) / Liu, J. (author) / Gao, W. (author) / Pan, R. (author) / Chai, Z. (author)

Published in:

JOURNAL OF TEXTILE RESEARCH ; 32 ; 49-53

Publication date:

2011-01-01

Size:

5 pages

ISSN:

0253-9721

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 677

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