Characterization of Grain Boundaries of Lead-Free Semiconducting Ceramics Using BaTiO~3-(Bi~1~/~2K~1~/~2)TiO~3 System: Fid-Bau Portal

Characterization of Grain Boundaries of Lead-Free Semiconducting Ceramics Using BaTiO~3-(Bi~1~/~2K~1~/~2)TiO~3 System

Takeda, H. / Sang, H.J. / Tateishi, T. / Kunej, S. / Leach, C. / Freer, R. / Hoshina, T. / Tsurumi, T.

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Characterization of Grain Boundaries of Lead-Free Semiconducting Ceramics Using BaTiO~3-(Bi~1~/~2K~1~/~2)TiO~3 System

Takeda, H. / Sang, H.J. / Tateishi, T. / Kunej, S. / Leach, C. / Freer, R. / Hoshina, T. / Tsurumi, T.

Characterization of Grain Boundaries of Lead-Free Semiconducting Ceramics Using BaTiO~3-(Bi~1~/~2K~1~/~2)TiO~3 System

Takeda, H. / Sang, H.J. / Tateishi, T. / Kunej, S. / Leach, C. / Freer, R. / Hoshina, T. / Tsurumi, T.

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Document information

Title:

Characterization of Grain Boundaries of Lead-Free Semiconducting Ceramics Using BaTiO~3-(Bi~1~/~2K~1~/~2)TiO~3 System

Contributors:

Takeda, H. (author) / Sang, H.J. (author) / Tateishi, T. (author) / Kunej, S. (author) / Leach, C. (author) / Freer, R. (author) / Hoshina, T. (author) / Tsurumi, T. (author) / Shinozaki, K. / Fujihara, S.

Published in:

Electroceramics in Japan XIV Selected, peer reviewed papers from the 30^t^h Electronics Division Meeting of the Ceramic Society of Japan, October 29-30, 2010, Tokyo, Japan ; 241-244

KEY ENGINEERING MATERIALS ; 485

Publication date:

2011-01-01

Size:

4 pages

ISSN:

1013-9826

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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Cho, Y. K. / Yoon, D. Y. | British Library Online Contents | 2004