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Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling
Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling
Direct Probing of Nanodimensioned Oxide Multilayers with the Aid of Focused Ion Beam Milling
Kuru, Y. (author) / Jalili, H. (author) / Cai, Z. (author) / Yildiz, B. (author) / Tuller, H. L. (author)
ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 23 ; 4543-4548
2011-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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