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    Scanning Micro Reference Electrode Testing of Localized Corrosion at Cu/Solderingtin Interface in Early Stage

    New search for: Liu, S.-c.
    New search for: Qu, W.-j.

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    Scanning Micro Reference Electrode Testing of Localized Corrosion at Cu/Solderingtin Interface in Early Stage

    New search for: Liu, S.-c.
    New search for: Qu, W.-j.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Scanning Micro Reference Electrode Testing of Localized Corrosion at Cu/Solderingtin Interface in Early Stage

    New search for: Liu, S.-c.
    New search for: Qu, W.-j.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Scanning Micro Reference Electrode Testing of Localized Corrosion at Cu/Solderingtin Interface in Early Stage

    Contributors:

    Liu, S.-c. (author) / Qu, W.-j. (author)

    Published in:

    CORROSION AND PROTECTION -NANCHANG- ; 32 ; 658-660

    Publication date:

    2011-01-01

    Size:

    3 pages

    ISSN:

    1005-748X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11223

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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