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Effect of surface metrology on the wettability of SiO2 nanoparticle coating

Athauda, T. J. / Decker, D. S. / Ozer, R. R.

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Effect of surface metrology on the wettability of SiO2 nanoparticle coating

Athauda, T. J. / Decker, D. S. / Ozer, R. R.

Effect of surface metrology on the wettability of SiO2 nanoparticle coating

Athauda, T. J. / Decker, D. S. / Ozer, R. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

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Document information

Title:

Effect of surface metrology on the wettability of SiO2 nanoparticle coating

Contributors:

Athauda, T. J. (author) / Decker, D. S. (author) / Ozer, R. R. (author)

Published in:

MATERIALS LETTERS ; 67 ; 338-341

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0167-577X

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1105 / 530

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