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    Variance of the fatigue damage due to a Gaussian narrowband process

    New search for: Low, Y. M.

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    Variance of the fatigue damage due to a Gaussian narrowband process

    New search for: Low, Y. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Variance of the fatigue damage due to a Gaussian narrowband process

    New search for: Low, Y. M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Variance of the fatigue damage due to a Gaussian narrowband process

    Contributors:

    Low, Y. M. (author)

    Published in:

    STRUCTURAL SAFETY ; 34 ; 381-389

    Publication date:

    2012-01-01

    Size:

    9 pages

    ISSN:

    0167-4730

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  624.17

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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