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Twin wall distortions through structural investigation of epitaxial BiFeO~3 thin films

Folkman, C.M. / Baek, S.-H. / Eom, C.-B.

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Twin wall distortions through structural investigation of epitaxial BiFeO~3 thin films

Folkman, C.M. / Baek, S.-H. / Eom, C.-B.

Twin wall distortions through structural investigation of epitaxial BiFeO~3 thin films

Folkman, C.M. / Baek, S.-H. / Eom, C.-B.

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Access via TIB

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Order at Subito €

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Document information

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Document information

Title:

Twin wall distortions through structural investigation of epitaxial BiFeO~3 thin films

Contributors:

Folkman, C.M. (author) / Baek, S.-H. (author) / Eom, C.-B. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 2844-2853

Publication date:

2011-01-01

Size:

10 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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