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    Development of rf plasma sputtered Al2O3-TiO2 multilayer broad band antireflecting coatings and its correlation with plasma parameters

    New search for: Laha, P.
    New search for: Panda, A. B.
    New search for: Mahapatra, S. K.
    New search for: Barhai, P. K.
    New search for: Das, A. K.
    New search for: Banerjee, I.

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    Development of rf plasma sputtered Al2O3-TiO2 multilayer broad band antireflecting coatings and its correlation with plasma parameters

    New search for: Laha, P.
    New search for: Panda, A. B.
    New search for: Mahapatra, S. K.
    New search for: Barhai, P. K.
    New search for: Das, A. K.
    New search for: Banerjee, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Development of rf plasma sputtered Al2O3-TiO2 multilayer broad band antireflecting coatings and its correlation with plasma parameters

    New search for: Laha, P.
    New search for: Panda, A. B.
    New search for: Mahapatra, S. K.
    New search for: Barhai, P. K.
    New search for: Das, A. K.
    New search for: Banerjee, I.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Development of rf plasma sputtered Al2O3-TiO2 multilayer broad band antireflecting coatings and its correlation with plasma parameters

    Contributors:

    Laha, P. (author) / Panda, A. B. (author) / Mahapatra, S. K. (author) / Barhai, P. K. (author) / Das, A. K. (author) / Banerjee, I. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 2275-2282

    Publication date:

    2012-01-01

    Size:

    8 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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