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    Effect of deposition temperature on orientation and electrical properties of (K0.5Na0.5)NbO3 thin films by pulsed laser deposition

    New search for: Tian, A.
    New search for: Ren, W.
    New search for: Wang, L.
    New search for: Shi, P.
    New search for: Chen, X.
    New search for: Wu, X.
    New search for: Yao, X.

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    Effect of deposition temperature on orientation and electrical properties of (K0.5Na0.5)NbO3 thin films by pulsed laser deposition

    New search for: Tian, A.
    New search for: Ren, W.
    New search for: Wang, L.
    New search for: Shi, P.
    New search for: Chen, X.
    New search for: Wu, X.
    New search for: Yao, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of deposition temperature on orientation and electrical properties of (K0.5Na0.5)NbO3 thin films by pulsed laser deposition

    New search for: Tian, A.
    New search for: Ren, W.
    New search for: Wang, L.
    New search for: Shi, P.
    New search for: Chen, X.
    New search for: Wu, X.
    New search for: Yao, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Effect of deposition temperature on orientation and electrical properties of (K0.5Na0.5)NbO3 thin films by pulsed laser deposition

    Contributors:

    Tian, A. (author) / Ren, W. (author) / Wang, L. (author) / Shi, P. (author) / Chen, X. (author) / Wu, X. (author) / Yao, X. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 2674-2678

    Publication date:

    2012-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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