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    Fundamentals of Pulsed and Direct Current Electrophoretic Infiltration Kinetics

    New search for: Palmer, T.R.
    New search for: Buie, C.R.
    New search for: Boccaccini, A.R.
    New search for: Van der Biest, O.
    New search for: Clasen, R.
    New search for: Dickerson, J.H.

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    Fundamentals of Pulsed and Direct Current Electrophoretic Infiltration Kinetics

    New search for: Palmer, T.R.
    New search for: Buie, C.R.
    New search for: Boccaccini, A.R.
    New search for: Van der Biest, O.
    New search for: Clasen, R.
    New search for: Dickerson, J.H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Fundamentals of Pulsed and Direct Current Electrophoretic Infiltration Kinetics

    New search for: Palmer, T.R.
    New search for: Buie, C.R.
    New search for: Boccaccini, A.R.
    New search for: Van der Biest, O.
    New search for: Clasen, R.
    New search for: Dickerson, J.H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Fundamentals of Pulsed and Direct Current Electrophoretic Infiltration Kinetics

    Contributors:

    Palmer, T.R. (author) / Buie, C.R. (author) / Boccaccini, A.R. / Van der Biest, O. / Clasen, R. / Dickerson, J.H.

    Published in:

    Electrophoretic Deposition: Fundamentals and Applications IV Selected, peer reviewed papers from the 4th International Conference on Electrophoretic Deposition: Fundamentals and Applications, October 2-7, 2011, Puerto Vallarta, Mexico ; 53-60

    KEY ENGINEERING MATERIALS ; 507

    Publication date:

    2012-01-01

    Size:

    8 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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