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    EBSD-Based Techniques for Characterization of Microstructural Restoration Processes during Annealing of Metals Deformed to Large Plastic Strains

    New search for: Godfrey, A.
    New search for: Mishin, O.V.
    New search for: Yu, T.B.
    New search for: Palmiere, E.J.
    New search for: Wynne, B.P.

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    EBSD-Based Techniques for Characterization of Microstructural Restoration Processes during Annealing of Metals Deformed to Large Plastic Strains

    New search for: Godfrey, A.
    New search for: Mishin, O.V.
    New search for: Yu, T.B.
    New search for: Palmiere, E.J.
    New search for: Wynne, B.P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    EBSD-Based Techniques for Characterization of Microstructural Restoration Processes during Annealing of Metals Deformed to Large Plastic Strains

    New search for: Godfrey, A.
    New search for: Mishin, O.V.
    New search for: Yu, T.B.
    New search for: Palmiere, E.J.
    New search for: Wynne, B.P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    EBSD-Based Techniques for Characterization of Microstructural Restoration Processes during Annealing of Metals Deformed to Large Plastic Strains

    Contributors:

    Godfrey, A. (author) / Mishin, O.V. (author) / Yu, T.B. (author) / Palmiere, E.J. / Wynne, B.P.

    Published in:

    Recrystallization and Grain Growth IV ; 203-210

    MATERIALS SCIENCE FORUM ; 715/716

    Publication date:

    2012-01-01

    Size:

    8 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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