In Situ Observations and Measurements of Mechanically Induced Grain Boundary Migration in a Scanning Electron Microscope: Fid-Bau Portal

In Situ Observations and Measurements of Mechanically Induced Grain Boundary Migration in a Scanning Electron Microscope

Gorkaya, T. / Burlet, T. / Molodov, D.A. / Gottstein, G.

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In Situ Observations and Measurements of Mechanically Induced Grain Boundary Migration in a Scanning Electron Microscope

Gorkaya, T. / Burlet, T. / Molodov, D.A. / Gottstein, G.

In Situ Observations and Measurements of Mechanically Induced Grain Boundary Migration in a Scanning Electron Microscope

Gorkaya, T. / Burlet, T. / Molodov, D.A. / Gottstein, G.

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Document information

Title:

In Situ Observations and Measurements of Mechanically Induced Grain Boundary Migration in a Scanning Electron Microscope

Contributors:

Gorkaya, T. (author) / Burlet, T. (author) / Molodov, D.A. (author) / Gottstein, G. (author) / Palmiere, E.J. / Wynne, B.P.

Published in:

Recrystallization and Grain Growth IV ; 819-824

MATERIALS SCIENCE FORUM ; 715/716

Publication date:

2012-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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