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    Microstructural study of boron-doped Co-Re-Cr alloys by means of transmission electron microscopy and electron energy-loss spectroscopy

    New search for: Bolitz, M.-C.
    New search for: Brunner, M.
    New search for: Volkl, R.
    New search for: Mukherji, D.
    New search for: Roesler, J.
    New search for: Glatzel, U.

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    Microstructural study of boron-doped Co-Re-Cr alloys by means of transmission electron microscopy and electron energy-loss spectroscopy

    New search for: Bolitz, M.-C.
    New search for: Brunner, M.
    New search for: Volkl, R.
    New search for: Mukherji, D.
    New search for: Roesler, J.
    New search for: Glatzel, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microstructural study of boron-doped Co-Re-Cr alloys by means of transmission electron microscopy and electron energy-loss spectroscopy

    New search for: Bolitz, M.-C.
    New search for: Brunner, M.
    New search for: Volkl, R.
    New search for: Mukherji, D.
    New search for: Roesler, J.
    New search for: Glatzel, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Microstructural study of boron-doped Co-Re-Cr alloys by means of transmission electron microscopy and electron energy-loss spectroscopy

    Contributors:

    Bolitz, M.-C. (author) / Brunner, M. (author) / Volkl, R. (author) / Mukherji, D. (author) / Roesler, J. (author) / Glatzel, U. (author)

    Published in:

    INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 103 ; 554-558

    Publication date:

    2012-01-01

    Size:

    5 pages

    ISSN:

    1862-5282

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  669.9

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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