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    Fabrication and Characterization of n-ZnO/p-SiC Heterojunction Diode

    New search for: Guziewicz, M.
    New search for: Jung, W.
    New search for: Kruszka, R.
    New search for: Domagala, J.
    New search for: Piotrowska, A.
    New search for: Golaszewska, K.
    New search for: Wachnicki, L.
    New search for: Guziewicz, E.
    New search for: Godlewski, M.

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    Fabrication and Characterization of n-ZnO/p-SiC Heterojunction Diode

    New search for: Guziewicz, M.
    New search for: Jung, W.
    New search for: Kruszka, R.
    New search for: Domagala, J.
    New search for: Piotrowska, A.
    New search for: Golaszewska, K.
    New search for: Wachnicki, L.
    New search for: Guziewicz, E.
    New search for: Godlewski, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Fabrication and Characterization of n-ZnO/p-SiC Heterojunction Diode

    New search for: Guziewicz, M.
    New search for: Jung, W.
    New search for: Kruszka, R.
    New search for: Domagala, J.
    New search for: Piotrowska, A.
    New search for: Golaszewska, K.
    New search for: Wachnicki, L.
    New search for: Guziewicz, E.
    New search for: Godlewski, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Fabrication and Characterization of n-ZnO/p-SiC Heterojunction Diode

    Contributors:

    Guziewicz, M. (author) / Jung, W. (author) / Kruszka, R. (author) / Domagala, J. (author) / Piotrowska, A. (author) / Golaszewska, K. (author) / Wachnicki, L. (author) / Guziewicz, E. (author) / Godlewski, M. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 717/720 ; 1323-1326

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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