A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Nondestructive testing of the thermal resistance of Gann diodes during their manufacture
Nondestructive testing of the thermal resistance of Gann diodes during their manufacture
Nondestructive testing of the thermal resistance of Gann diodes during their manufacture
Yurchenko, V. I. (author) / Yurchenko, N. M. (author)
2012-01-01
5 pages
Article (Journal)
English
DDC:
620.1127
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