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An Extended EDMR Setup for SiC Defect Characterization
An Extended EDMR Setup for SiC Defect Characterization
An Extended EDMR Setup for SiC Defect Characterization
Gruber, G. (author) / Koch, M. (author) / Pobegen, G. (author) / Nelhiebel, M. (author) / Hadley, P. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.
2013-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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