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Evaluation of PBTS and NBTS in SiC MOS Using In Situ Charge Pumping Measurements
Evaluation of PBTS and NBTS in SiC MOS Using In Situ Charge Pumping Measurements
Evaluation of PBTS and NBTS in SiC MOS Using In Situ Charge Pumping Measurements
Habersat, D.B. (author) / Lelis, A.J. (author) / Green, R. (author) / El, M. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.
2013-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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