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High-Temperature Characterization of 4H-SiC Darlington Transistors for Low Voltage Applications
High-Temperature Characterization of 4H-SiC Darlington Transistors for Low Voltage Applications
High-Temperature Characterization of 4H-SiC Darlington Transistors for Low Voltage Applications
Lanni, L. (author) / Malm, B.G. (author) / Zetterling, C.M. (author) / Ostling, M. (author) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.
2013-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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