Study of behaviors of aluminum overlayers deposited on uranium via AES, EELS, and XPS: Fid-Bau Portal

Study of behaviors of aluminum overlayers deposited on uranium via AES, EELS, and XPS

Liu, K. / Luo, L. / Zhou, W. / Yang, J. / Xiao, H. / Hong, Z. / Yang, H.

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Study of behaviors of aluminum overlayers deposited on uranium via AES, EELS, and XPS

Liu, K. / Luo, L. / Zhou, W. / Yang, J. / Xiao, H. / Hong, Z. / Yang, H.

Study of behaviors of aluminum overlayers deposited on uranium via AES, EELS, and XPS

Liu, K. / Luo, L. / Zhou, W. / Yang, J. / Xiao, H. / Hong, Z. / Yang, H.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Study of behaviors of aluminum overlayers deposited on uranium via AES, EELS, and XPS

Contributors:

Liu, K. (author) / Luo, L. (author) / Zhou, W. (author) / Yang, J. (author) / Xiao, H. (author) / Hong, Z. (author) / Yang, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 270 ; 184-189

Publication date:

2013-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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