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Lattice distortion and strain relaxation in epitaxial thin films of multiferroic TbMnO3 probed by X-ray diffractometry and micro-Raman spectroscopy
Lattice distortion and strain relaxation in epitaxial thin films of multiferroic TbMnO3 probed by X-ray diffractometry and micro-Raman spectroscopy
Lattice distortion and strain relaxation in epitaxial thin films of multiferroic TbMnO3 probed by X-ray diffractometry and micro-Raman spectroscopy
Hu, Y. (author) / Stender, D. (author) / Medarde, M. (author) / Lippert, T. (author) / Wokaun, A. (author) / Schneider, C. W. (author)
APPLIED SURFACE SCIENCE ; 278 ; 92-95
2013-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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