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    Effect of Annealing Temperature on Microstructure and Electrochromic Properties of PEG-doping Tungsten Oxide Thin Films

    New search for: Sun, X.-l.
    New search for: Fang, Y.-q.

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    Effect of Annealing Temperature on Microstructure and Electrochromic Properties of PEG-doping Tungsten Oxide Thin Films

    New search for: Sun, X.-l.
    New search for: Fang, Y.-q.

    Access

    Access via TIB
    Check availability in my library
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    Effect of Annealing Temperature on Microstructure and Electrochromic Properties of PEG-doping Tungsten Oxide Thin Films

    New search for: Sun, X.-l.
    New search for: Fang, Y.-q.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Effect of Annealing Temperature on Microstructure and Electrochromic Properties of PEG-doping Tungsten Oxide Thin Films

    Contributors:

    Sun, X.-l. (author) / Fang, Y.-q. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -HANGZHOU- ; 31 ; 175-180

    Publication date:

    2013-01-01

    Size:

    6 pages

    ISSN:

    1673-2812

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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