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    X-ray spectroscopic methods in the studies of nonstoichiometric TiO2-x thin films

    New search for: Kollbek, K.
    New search for: Sikora, M.
    New search for: Kapusta, C.
    New search for: Szlachetko, J.
    New search for: Zakrzewska, K.
    New search for: Kowalski, K.
    New search for: Radecka, M.

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    X-ray spectroscopic methods in the studies of nonstoichiometric TiO2-x thin films

    New search for: Kollbek, K.
    New search for: Sikora, M.
    New search for: Kapusta, C.
    New search for: Szlachetko, J.
    New search for: Zakrzewska, K.
    New search for: Kowalski, K.
    New search for: Radecka, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray spectroscopic methods in the studies of nonstoichiometric TiO2-x thin films

    New search for: Kollbek, K.
    New search for: Sikora, M.
    New search for: Kapusta, C.
    New search for: Szlachetko, J.
    New search for: Zakrzewska, K.
    New search for: Kowalski, K.
    New search for: Radecka, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    X-ray spectroscopic methods in the studies of nonstoichiometric TiO2-x thin films

    Contributors:

    Kollbek, K. (author) / Sikora, M. (author) / Kapusta, C. (author) / Szlachetko, J. (author) / Zakrzewska, K. (author) / Kowalski, K. (author) / Radecka, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 281 ; 100-104

    Publication date:

    2013-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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