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An in-situ transmission electron microscopy study on room temperature ductility of TiAl alloys with fully lamellar microstructure
An in-situ transmission electron microscopy study on room temperature ductility of TiAl alloys with fully lamellar microstructure
An in-situ transmission electron microscopy study on room temperature ductility of TiAl alloys with fully lamellar microstructure
Kim, S. W. (author) / Na, Y. S. (author) / Yeom, J. T. (author) / Kim, S. E. (author) / Choi, Y. S. (author)
MATERIALS SCIENCE AND ENGINEERING A ; 589 ; 140-145
2014-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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