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    Evolution of Residual Micro Phase and Orientation Dependent Stresses during Cold Wire Drawing

    New search for: Kriska, M.
    New search for: Tacq, J.
    New search for: van Acker, K.
    New search for: Seefeldt, M.
    New search for: Kurz, S.J.B.
    New search for: Mittemeijer, E.J.
    New search for: Scholtes, B.

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    Evolution of Residual Micro Phase and Orientation Dependent Stresses during Cold Wire Drawing

    New search for: Kriska, M.
    New search for: Tacq, J.
    New search for: van Acker, K.
    New search for: Seefeldt, M.
    New search for: Kurz, S.J.B.
    New search for: Mittemeijer, E.J.
    New search for: Scholtes, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evolution of Residual Micro Phase and Orientation Dependent Stresses during Cold Wire Drawing

    New search for: Kriska, M.
    New search for: Tacq, J.
    New search for: van Acker, K.
    New search for: Seefeldt, M.
    New search for: Kurz, S.J.B.
    New search for: Mittemeijer, E.J.
    New search for: Scholtes, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Evolution of Residual Micro Phase and Orientation Dependent Stresses during Cold Wire Drawing

    Contributors:

    Kriska, M. (author) / Tacq, J. (author) / van Acker, K. (author) / Seefeldt, M. (author) / Kurz, S.J.B. / Mittemeijer, E.J. / Scholtes, B.

    Published in:

    International Conference on Residual Stresses 9 (ICRS 9) ; 327-334

    MATERIALS SCIENCE FORUM ; 768/769

    Publication date:

    2014-01-01

    Size:

    8 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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