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    Fatigue crack growth rates of API X70 pipeline steel in a pressurized hydrogen gas environment

    New search for: Drexler, E. S.
    New search for: Slifka, A. J.
    New search for: Amaro, R. L.
    New search for: Barbosa, N.
    New search for: Lauria, D. S.
    New search for: Hayden, L. E.
    New search for: Stalheim, D. G.

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    Fatigue crack growth rates of API X70 pipeline steel in a pressurized hydrogen gas environment

    New search for: Drexler, E. S.
    New search for: Slifka, A. J.
    New search for: Amaro, R. L.
    New search for: Barbosa, N.
    New search for: Lauria, D. S.
    New search for: Hayden, L. E.
    New search for: Stalheim, D. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Fatigue crack growth rates of API X70 pipeline steel in a pressurized hydrogen gas environment

    New search for: Drexler, E. S.
    New search for: Slifka, A. J.
    New search for: Amaro, R. L.
    New search for: Barbosa, N.
    New search for: Lauria, D. S.
    New search for: Hayden, L. E.
    New search for: Stalheim, D. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Fatigue crack growth rates of API X70 pipeline steel in a pressurized hydrogen gas environment

    Contributors:

    Drexler, E. S. (author) / Slifka, A. J. (author) / Amaro, R. L. (author) / Barbosa, N. (author) / Lauria, D. S. (author) / Hayden, L. E. (author) / Stalheim, D. G. (author)

    Published in:

    FATIGUE AND FRACTURE OF ENGINEERING MATERIALS AND STRUCTURES ; 37 ; 517-525

    Publication date:

    2014-01-01

    Size:

    9 pages

    ISSN:

    8756-758X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1123

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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